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.:: IC Testing
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Scope of Test Services
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Chip
Testing Technology Training |
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Wafer
Testing @ Class 10K Clean Room |
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R&D
Prototyping, Product Evaluation, Verification and Analysis
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Temperature
and Humidity Stress Test |
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Optical
Data-Communication Testing |
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Development
of test program, automation |
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High
Frequency VNA & TDR Testing |
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Facility / Equipment List |
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1) Mini Environment (10K)(Installation) |
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2) Probe Station (SUSS) |
•Manual Probe Station
•6” Station, PM5
•PH100 Probe Head
•PH250 Probe Head
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3) Agilent –
E8362B (Vector Network Analyzer) – 20GHz |
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Application:
For RF components, Cellular, Bluetooth,
802.11 design test and measurements in laboratory. It is used to characterize
the device under test for its transfer functions, impedance, magnitudes and
phase
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4) Tektronix
– TDS8200 + 80E04 (Time Domain Reflectometry) – Dual
20GHz Sampling |
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Tektronix – TDS8200 + 80C12 (Multi-rate Telecom Optical
Sampling)
Application:
An oscilloscope for test and measure on electronics chips design,
RF designs, microwave, Time Domain Reflectometry and crosstalks focusing on short rise time (or high bandwidth).
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5) Tektronix AWG 520 |
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1 GS/s Programmable Dual Channel
Option: Data Generator
Application:
Offers real world simulations, such as corrupt ideal
waveforms, jitters in waveforms, EMP/EMI and other system noise, power supply
noise and ripple, transducer simulation. In addition to aid communications designs and test, such as digital
information encoding using FSK, PSK and QAM for cellular, fax and modern
communications
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6) LeCroy Wave Surfer 454 |
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4 Channels
Rise Time: 800ps
Sample Rate (One Shot): 2GS/s (Interleaved Mode)
500MHz Digital Storage Oscilloscope
Sampling Rate: 2GS/s
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| 7) Agilent –
E4440A (Spectrum Analyzer) – 26.5GHz |
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Application:
For
use to measure real time spectrum analysis on signals of frequency up to
26.5GHZ. Application may includes PCI Express, Inifiband, Fibre Channel (133Mb/s to 4.25 GB/s), USB 2.0, IEEE
1394b, SONET/SDH (up to OC48/STM16), Gigabit Ethernet, RapidIO
and Serial attached SCSI application.
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8) Tektronix – AWG520 (Arbitrary
Waveform Generator) – 1GS/s Dual Channel |
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9) Agilent –
N4901B (Serial Bert – Pulse Pattern Generator) – 13.5Gb/s |
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N4901B-200
– Pattern Generator
Application:
For
PCI Express, Inifiband, Fibre
Channel (133Mb/s to 4.25 GB/s), USB 2.0, IEEE 1394b, SONET/SDH (up to
OC48/STM16), Gigabit Ethernet, RapidIO and Serial
attached SCSI application
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| 10) Agilent –
8163B + 81578A (Optical Attenuator) |
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Agilent – 8163B + 81635A (Optical Power Sensor)
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| 11) Dagatron
8220 Function Generator |
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20MHz
Sine
Square
Sawtooth
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12) Espec – SH241 (Temperature +
Humidity Oven) |
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•Espec SH241
Temperature: -40ºC to +150ºC
Relative Humidity: +30% to +95%
Viewing Windows
Castors
Access Panel
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13) LTX – TS88 (Automated Testing
Equipment – ATE) |
•LTX TS88
Tester
•MV200
•4 Test Heads
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| 14) Digital Tester –
Credence D10 |
96 digital channels
16 digital power supplies
DIBU card
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SHRDC Test Lab Equipment Usage Rates |
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Make |
Model |
Descriptions |
Specifications |
Test
Lab Rates (Per Hour) |
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Agilent |
E8362B |
VNA |
10MHz
to 20GHz Vector Network Analyzer, 2 port, 4 receiver - Options:
014,UNL,016,080,081,083 - Options: Ecal Module: N4691B - 300KHz to
26.5GHz |
100.00 |
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Agilent |
E4440A
+ N4001A |
Spectrum Analyzer + Noise Source |
PSA
Spectrum Analyzer 3Hz to 26.5GHz - Options: B7J,241,226,219 - 10MHz to
18GHz SNS Noise Source nominal ENR 15dB (MAIN) |
70.00 |
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Agilent |
N4901B-200 |
PPG |
Serial
Bert 13.5Gb/s, Pattern Generator |
70.00 |
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Agilent |
8163B +
81578A + 81635A |
Mainframe + Optical Attenuator + optical Power Sensor |
Lightwave Multimeter, Mainframe - Optical Attenuator, Multimode,
Straight, 700-1400nm - Optical Power Sensor Dual Channel |
40.00 |
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Tektronix |
AWG520 |
Arbitrary Waveform Generator |
1GS/s
Programmable Dual Channel Arbitrary Waveform Generator |
40.00 |
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Tektronix |
TDS8200
+ 80E04 + 80A02 + 80C12 +P8108 |
DSO +
TDR + EOD/ESD + Optical Sampling + Probe |
Digital
Sampling Oscilloscope - Dual 20GHz Sampling Module (TDR) - EOS/ESD
Protection Module - Multi-rate, Datacome & Telecom Optical Sampling
Module - Handheld TDR Probe |
70.00 |
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Tektronix |
TDS3032B + P6139A |
DPO +
Passive Probe |
2Ch
300MHz Digital Phosphor Oscilloscope - Sampling Rate: 2.5GS/s |
40.00 |
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Tektronix |
DPO4014
+ P6139A |
DPO +
Passive Probe |
4Ch
1GHz Digital Phosphor Oscilloscope - Samping Rate: 5GS/s |
60.00 |
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Tektronix |
AFG3102 |
Arbitrary Function Generator |
2Ch
100MHz Arbitrary Function Generator, Arbitrary up to 50MHz |
40.00 |
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LeCroy |
WaveSurfer 454 |
DSO +
Passive Probe |
4Ch
500MHz Digital Storage Oscilloscope, Sampling Rate: 2GS/s |
40.00 |
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SUSS |
PM5 |
Probe
Station |
PM5 III
Manual Probe Station - Options: PH100, PH250, Z Probe GSG |
70.00 |
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Espec |
SH241 |
Oven |
Bench
Top Type Temperature and Humidity Chamber - Temperature Range: -40C to
150C, Humidity Range: 30% to 95%RH |
40.00 |
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Olympus |
SZ61TR |
Stereo
Microscope + CCD Camera |
Eyepieces (15x / 30x), Objective (0.67x
to 4.5x) |
10.00 /
image |
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LTX |
TS88 |
TS88
Analog Tester |
1AS,
1AV, 1MM, 2QVS, 6VI, 2PVI Kepco |
70.00 |
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Credence |
Sapphire D10 |
D10
Digital Tester |
Linux
System, ITE, DPIN96, DPS16, DIBU |
90.00 |
Further information, please contact us at 03-55133560 or email to
info@shrdc.org.my |
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