Complimentary Technical Communication Series – High
Speed Test and Equipment
SHRDC
6 March 2012
This is a complimentary one day workshop open to all interested industry engineering personnel, electronic hobbyists, students and academics. Join us for this workshop to gain updated information on latest electronic systems & design industry in test strategies, measurement & design services, and test equipment updates. | Time | Agenda |
| 9:00a.m – 9:15a.m | Registration [4th Floor LBC Room] Coffee & Tea : Networking |
| 9:15a.m - 10:00a.m | Welcoming Note and MIMs Introduction by Mr. Halim Osman Introduction to Polar Instrument (Asia Pacific) Pte Ltd Introduction to Genetron Sdn Bhd |
| 10:00a.m - 10:30am | Tea break & networking |
| 10:30a.m - 12:30am | Polar Instrument (AP) : Mr. Sarang Kuchhal TOPIC 1: DESIGN & TESTING OF NEXT GENERATION HIGH SPEED PCBs |
| 12:30p.m - 2:00pm | Lunch break & networking Equipment or Software Demo session |
| 2:00p.m – 3.30pm | Genetron Sdn Bhd: Mr. Raymong Ko TOPIC 2: TEST AND MEASUREMENT EQUIPMENT REQUIREMENTS FOR HIGH SPEED DIGITAL DESIGN |
| 3.30p.m – 4.00pm | Token of Appreciation (Speakers) & Gifts Away (Participants) End Session |
*Remember to bring your name card for a surprise gift-away at the end of day.
Good Luck !
TOPIC 1: DESIGN & TESTING OF NEXT GENERATION HIGH SPEED PCBS
The early 1990s saw the advent of high speed signals on PCBs that required designers to control and measure controlled impedance on transmission lines to ensure proper signal transfers on PCBs. As we step into the next decade the industry stands at the door of another major technological innovation. With the introduction of the new chipsets, digital signals speeds will be pushed multiple times faster on PCB transmission lines. This will require controlling losses as the primary factor of concern. The presentation will cover why controlling losses will be the key parameter to control as it will require designers to design multi-layered PCB stacks by choosing right PCB materials and optimizing traces to minimizing losses on transmission lines. The presentation will explain the types of losses and their effects on high speed design. The presentation will also touch upon introducing new commercially available tools like Polar - Si9000e, Speedstack SI, C Gen SI and Atlas 2012, that will help designers to simulate, design and measure losses for next gen high speed boards.Speaker :
Sarang Kuchhal – Sales & Application Engineer, Polar Instruments (Asia Pacific) Pte Ltd, Singapore.
TOPIC 2:TEST AND MEASUREMENT EQUIPMENT REQUIREMENTS FOR HIGH SPEED DIGITAL DESIGN
Over the past few years, the development of true analogue CMOS processes has led to the use of high-speed analogue devices in the digital arena. System speeds of 150 MHz and higher have become common for digital logic. Systems that were considered high end and high speed a few years ago are now cheaply and easily implemented. However, this integration of fast system speeds brings with it the challenges of analogue system design to a digital world. Introduction of new serial bus standards such as PCIe Gen 3,USB3, 10G Gigabit Ethernet, Thunderbolt, all the while utilizing the same copper layout designs on the PCB requires serious understanding into signal integrity when performing high speed serial data transfer.
LeCroy Corporation introduces a line-up of High Speed Serial Data solutions, the worlds’ highest bandwidth Real Time Oscilloscope up to 60GHz, the Serial Data Analysis Software, SDA2, Powerful Transceiver design software tool, EyeDoc 2 and the latest SPARQ, a new genre in test equipment eliminating the need for the expensive VNA for board designers’ S-Parameter needs.
The presentation and demo session will showcase the speed and ease of use in which High Speed Signal Jitter is broken down to its fundamental components. How the EyeDoc2 software help designers in making the right decision on equalizer designs for transceivers and how SPARQ generates S-Parameter files with a touch of a button.
Speaker:
Raymond Ko is the Application and Sales Manager for Genetron Sdn.Bhd. He has been in the test and measurement industry for the past 12 years. With LeCroy , he has worked alongside various customers such as Altera, Intel, Motorola, Delta Electronics, Western Digital, Proton and many others. Currently in the regional role, he is well versed in the intricacies of signal integrity for all applications using Digital Oscilloscopes. He is currently also in charge of the Research and Development team in Genetron Singapore for Wallace Fly Height Tester.
SHRDC Technical Training / Workshop Updates:
Join us for the following technical workshops in Singapore and Penang:| Introduction to HDI Technology [part 1] Trainer: Happy Holden |
12-13 Mar [Singapore] 19-20 Mar [Penang] |
| Next Generation HDI, Advanced
Fabrication and Design [part 2] Trainer: Happy Holden |
14 Mar [Singapore] 21 Mar [Penang] |
| IPC PCB Designer CID Certified
Interconnect Designer Workshop and Exam Trainer: Cheah Soo Lan |
20-23 Mar [Singapore] 17-20 Apr [Penang] |
Contact Mr. Halim for more information. Tel: 03-55133560